United States
Field-Emission Scanning Electron Microscope (FE-SEM) with Brand Name Only Electron Backscatter Diffraction (EBSD) and Energy Dispersive Spectroscopy (EDS) Detectors and Analytical Software
See attached Form SF1449 for details.
- Buyer
- COMMERCE, DEPARTMENT OF - NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY - DEPT OF COMMERCE NIST
- Country
- United States
- Location
- Gaithersburg, MD, USA
- Deadline
- September 15, 2026
- Published
- September 1, 2026
- Procedure
- Combined Synopsis/Solicitation
- Sector
- Laboratory, optical and precision equipments (excl. glasses)
- Source
- SAM.gov
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CPV NAICS:334516, PSC:6640